The optical confovis technology is based on structured illumination and does not use mechanical moving parts. This feature makes it fast, compact and robust. The novel technology is therefore very useful for industrial applications where speed is essential and a compact design allows integration within challenging environments.

The patented confovis technology produces confocal images (sometimes also referred to as optical sections) at high speed. A stack of optical sections then forms the basis for further analysis and measurement of the sample similar to confocal microscopy.

The sample is scanned using a wide-field arrangement by means of only two illumination patterns in every focal plane and without the use of moving mechanical parts. Therefore high scanning speeds can be achieved that are only limited by the performance of the camera used. Z-resolution (axial) in the nanometer range is achieved.

For most applications the costly and complex confocal technology can be replaced. The software is user-friendly and based on a novel mathematical approach.

• Semiconductor manufacturing and inspection
• Monitoring of precision milling and grinding
• Flat panel displays
• Laser material processing
• Lens defect measurements
• Medical device inspection
• Optoelectronics and Solid state lighting
• Forensics and bullet matching
• MEMS
• Coatings and polymer surfaces
• Automotive quality inspection
• Microfluidic chip inspection
• Metallurgy
• Fabrics and textiles
• Composites and ceramics